Conference on Control and Fault-Tolerant Systems (SysTol’10)
October 6-8, 2010, Nice, France
Proceedings are published on IEEE Xplore.
The SysTol’10 Conference Program can now be inspected in detailed at the Papercept website below.
The scientific program consists of:
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Plenary and semi-plenary lectures by invited speakers; -
Regular paper presentations in oral sessions;
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Invited sessions;
Dr. Xavier Olive
Thales Alenia Space, France
How to deal with high availability and robustness in Space domain? - FDI(R) for satellite at Thales Alenia Space
Prof. Marios Polycarpou
University of Cyprus, Cyprus
Intelligent Monitoring and Fault Tolerance in Large-Scale Distributed Systems
Prof. Venkat Venkatasubramanian
Purdue University, USA
Abnormal Events Management in Complex Process Plants: Challenges, Opportunities, and Emerging Trends
Prof. Christopher Edwards
University of Leicester, UK
Sliding mode schemes for fault tolerant control
Prof. Jin Jiang
The University of Western Ontario, Canada
Why does one need fault-tolerant control systems anyway?
Dr. Henrik Niemann
Technical University of Denmark
A model-based approach for fault-tolerant control
Prof. Dariusz Uciński
University of Zielona Góra, Poland
Sensor network scheduling for identification of spatially distributed processes
II
Home | Call | Chairs & IPC | Sessions | Submission | Program | Travel | Photos
Wednesday, October 6
Thursday, October 7
Friday, October 8
SysTol’10 Conference
Registration desk: 8h30 - 18h45
Opening Ceremony: 9h00 - 9h15
Conference hours: 9h20 - 18h35
Welcome Cocktail: 19h00, Host area, Acropolis Exhibition and Convention Centre
SysTol’10 Conference
Registration desk: 8h30 - 18h30
Conference hours: 9h00 - 17h55
Gala dinner: 20h00, “Palais de la Méditerranée”, 13 Promenade des Anglais, Nice
SysTol’10 Conference
Registration desk: 8h30 - 14h00
Conference hours: 9h00 - 15h40
(Pre) Registration desk: 16h00 - 18h00 (Information and registration desk)
Tuesday, October 5
A pre-registration could be done on Tuesday between 16h and 18h at the Information and Registration Desk.
All the attendees are kindly requested to wear their name badge during the conference.
CRAN
Research Centre for Automatic Control of Nancy
IEEE Control Systems
Society
French
GIS 3SGS
French
GDR MACS
Photo credits: © Degermann Caroline
